Title :
Three region Hetero-Material Gate Oxide Stack (TMGOS) Epi-MOSFET: A new device structure for reduced short channel effects
Author :
Goel, Kirti ; Saxena, Manoj ; Gupta, Mridula ; Gupta, R.S.
Keywords :
Analytical models; Boundary conditions; Educational institutions; Electric variables control; Electrons; Laboratories; Leakage current; MOSFETs; Semiconductor devices; Threshold voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1595983
