Title :
Network Analyzer Measurements and Physically Based Analysis of Amplitude and Phase Distortion in SiGeC HBTs
Author :
Malm, B. Gunnar ; Õstling, Mikael
Keywords :
Distortion measurement; Frequency; Heterojunction bipolar transistors; Intelligent networks; Linearity; Neodymium; Phase distortion; Phase measurement; Power measurement; Power system harmonics;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1595984