• DocumentCode
    3283267
  • Title

    Does retiming affect redundancy in sequential circuits?

  • Author

    Das, Debesh K. ; Bhattacharya, Bhargab B.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
  • fYear
    1996
  • fDate
    3-6 Jan 1996
  • Firstpage
    260
  • Lastpage
    263
  • Abstract
    Retiming is used to optimize logic and improve the speed of operation in sequential circuits keeping the circuit behavior unchanged. In this paper, we show with various examples that retiming affects redundancy of faults. It may change an operationally redundant fault to a partially one, and a combinationally redundant fault to an irredundant but sequentially untestable fault. Many novel transformations of combinational redundancy to sequential redundancies are also exemplified. Thus, retiming strongly influences test generation and design for testability techniques in sequential circuits
  • Keywords
    fault diagnosis; logic testing; redundancy; sequential circuits; timing; combinational redundancy; design for testability; fault; logic optimization; operation speed; retiming; sequential circuit; sequential redundancy; test generation; Circuit faults; Circuit testing; Clocks; Combinational circuits; Computer science; Electrical fault detection; Fault detection; Redundancy; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1996. Proceedings., Ninth International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-7228-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1996.489607
  • Filename
    489607