DocumentCode
3283267
Title
Does retiming affect redundancy in sequential circuits?
Author
Das, Debesh K. ; Bhattacharya, Bhargab B.
Author_Institution
Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
fYear
1996
fDate
3-6 Jan 1996
Firstpage
260
Lastpage
263
Abstract
Retiming is used to optimize logic and improve the speed of operation in sequential circuits keeping the circuit behavior unchanged. In this paper, we show with various examples that retiming affects redundancy of faults. It may change an operationally redundant fault to a partially one, and a combinationally redundant fault to an irredundant but sequentially untestable fault. Many novel transformations of combinational redundancy to sequential redundancies are also exemplified. Thus, retiming strongly influences test generation and design for testability techniques in sequential circuits
Keywords
fault diagnosis; logic testing; redundancy; sequential circuits; timing; combinational redundancy; design for testability; fault; logic optimization; operation speed; retiming; sequential circuit; sequential redundancy; test generation; Circuit faults; Circuit testing; Clocks; Combinational circuits; Computer science; Electrical fault detection; Fault detection; Redundancy; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1996. Proceedings., Ninth International Conference on
Conference_Location
Bangalore
ISSN
1063-9667
Print_ISBN
0-8186-7228-5
Type
conf
DOI
10.1109/ICVD.1996.489607
Filename
489607
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