Transient analysis of single interconnects characterized with measured S-parameter data

The correct modeling of the transmission lines requires accurate modeling of both the frequency-dependent conductor (skin effect) and the dielectric losses. The measured S-parameter data can easily capture the behavior of these losses. The discontinuities in interconnects are difficult to describe with closed form equations. They are better characterized with the measured S-parameter data. The integration of interconnects characterized with measured S-parameter into the scattering-parameter (S-parameter) macro-model based simulator has been proposed