• DocumentCode
    3283664
  • Title

    Large Temperature Dependence of Negative Differential Conductance in Room-Temperature Operating Silicon Single-Electron/Single-Hole Transistor

  • Author

    Kobayashi, Masaharu ; Miyaji, Kousuke ; Saitoh, Masumi ; Hiramoto, Toshiro

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    173
  • Lastpage
    174
  • Keywords
    Current measurement; Energy measurement; MOSFET circuits; Quantum dots; Resonant tunneling devices; Silicon; Single electron transistors; Size measurement; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596038
  • Filename
    1596038
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3283664