DocumentCode :
3283814
Title :
Surface and Interface Analysis of MgxZn1-xO cubic and hexagonal phases by X-Ray Photoelectron and Rutherford Back Scattering Spectroscopies
Author :
Hullavarad, S.S. ; Pugel, D.E. ; Dhar, S. ; Takeuchi, I. ; Venkatesan, T. ; Vispute, R.D.
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
195
Lastpage :
196
Keywords :
Alloying; Chemical analysis; Optical films; Optical scattering; Optical sensors; Particle scattering; Radiation detectors; Spectroscopy; X-ray scattering; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1596049
Filename :
1596049
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3283814
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