DocumentCode
3284038
Title
Polarization noise and reduction technology in micro optical gyroscope
Author
Liu, Huilan ; Feng, Lishuang ; Jiao, Zhichao ; Li, Ruya
Author_Institution
Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China
fYear
2011
fDate
20-23 Feb. 2011
Firstpage
956
Lastpage
959
Abstract
Micro optical gyroscope has advantages of integrated optoelectronic technology. Its ring resonator is fabricated by optical integrated technique. Polarization fluctuation induced noise is one of the dominant noise sources in resonator. State of polarization of the input light, polarization-maintaining quality of the coupler and the waveguide, and the temperature fluctuation are main parameters which affect polarization noise of micro optical gyro. Simulations and validation experiments were made for these factors. As a countermeasure, an improved layout for the gyroscope is put forward to reduce the polarization noise, which includes a polarizer in front of the resonator and the polarization-maintaining waveguide resonator. Polarization-maintaining waveguide and coupler were designed according to the theory of geometrical birefringence. The improved layout provides theoretical basis and guidance for further development of the micro optical gyroscope.
Keywords
birefringence; gyroscopes; integrated optoelectronics; micro-optics; optical couplers; optical noise; optical polarisers; optical resonators; optical waveguides; geometrical birefringence; integrated optoelectronic technology; micro-optical gyroscope; polarization fluctuation induced noise; polarization-maintaining quality; polarization-maintaining waveguide resonator; polarizer; ring resonator; temperature fluctuation; Noise; Optical device fabrication; Optical polarization; Optical ring resonators; Optical sensors; Optical waveguides; micro optical gyroscope; polarization noise; reduction Technology; resonator; state of polarization;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location
Kaohsiung
Print_ISBN
978-1-61284-775-7
Type
conf
DOI
10.1109/NEMS.2011.6017513
Filename
6017513
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