• DocumentCode
    3284049
  • Title

    Optical properties measurement of a dielectrophoresis-driven liquid-core/liquid-cladding optical waveguide

  • Author

    Lu, Yi-Wen ; Fan, Shih-Kang

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    20-23 Feb. 2011
  • Firstpage
    960
  • Lastpage
    963
  • Abstract
    In this paper, dielectrophoresis (DEP) and electrowetting-on-dielectric (EWOD) are used to generate a liquid-core/liquid-cladding optical waveguide. Different from continuously supplied core and cladding liquid in micromachined microchannel, EWOD creates a metered volume droplet which is later deformed by DEP to be the liquid core of the optical waveguide. Hence, the presented liquid-core/liquid-cladding optical waveguide is electrically tunable and programmable. The DEP-defined core liquid preserves the advantage of the smooth liquid-liquid interface, while the stationary core and cladding liquid would eliminate scattering losses caused by liquid flowing. Light transmission is achieved in the DEP-driven liquid-core/ liquid-cladding optical waveguide. The propagation loss is measured by observing the fluorescent change of 1 mM Rhodamine-dyed core liquid excited by a Nd-YAG II laser.
  • Keywords
    electrophoresis; light transmission; neodymium; optical variables measurement; optical waveguides; solid lasers; wetting; yttrium compounds; YAG:Nd; dielectrophoresis; electrowetting-on-dielectric; laser; light transmission; liquid-core/liquid-cladding optical waveguide; micromachined microchannel; optical properties measurement; rhodamine-dyed core liquid; Liquid waveguides; Optical pumping; Optical refraction; Optical scattering; Optical variables control; Optical variables measurement; Optical waveguides; dilectrophoresis; electrowetting-on-dielectrc; liquid-core/liquid-cladding; optical waveguide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-775-7
  • Type

    conf

  • DOI
    10.1109/NEMS.2011.6017514
  • Filename
    6017514