DocumentCode :
3284055
Title :
Topase-A tool for studying reliabilityof substrations
Author :
Renault, I. ; Bulot, M. ; Bourgade, E. ; Desmas, T.
Author_Institution :
Electricite de France
Volume :
2
fYear :
1993
fDate :
5-8 Sep 1993
Firstpage :
634
Lastpage :
639
Keywords :
Circuit faults; Data acquisition; Probability; Testing; Timing; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Athens Power Tech, 1993. APT 93. Proceedings. Joint International Power Conference
Type :
conf
DOI :
10.1109/APT.1993.673875
Filename :
673875
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3284055
