DocumentCode
3284250
Title
Design, characterization, and control of a monolithic three-axis high-bandwidth nanopositioning stage
Author
Kenton, B.J. ; Leang, K.K.
Author_Institution
Mech. Eng. Dept., Univ. of Nevada-Reno, Reno, NV, USA
fYear
2010
fDate
June 30 2010-July 2 2010
Firstpage
4949
Lastpage
4956
Abstract
A new three-axis serial-kinematic nanopositioning stage developed for high-bandwidth applications such as video-rate scanning probe microscopy (SPM) is presented. The stage employs uniquely designed compliant flexures for guiding the motion of the sample platform and to minimize parasitic motion (runout) and off-axis effects compared to previous designs. Finite element analysis (FEA) predicts the dominant resonances along the fast (x-axis) and slow (y-axis) scanning axes at 25.9 and 5.96 kHz, respectively. The performance of the nanopositioning stage is evaluated and the measured dominant resonances in the fast and slow scanning directions are 24.2 and 6.0 kHz, respectively, which are in good agreement with the FEA predictions. The lateral and vertical positioning range of the prototype stage is approximately 9 × 9 μm2 and 1 μm, respectively. Experimental atomic force microscope imaging and tracking results for closed- and open-loop feedforward control are presented to demonstrate the performance of the stage.
Keywords
closed loop systems; feedforward; finite element analysis; instrumentation; open loop systems; scanning probe microscopy; closed loop feedforward control; designed compliant flexures; finite element analysis; force microscope imaging; frequency 24.2 kHz; frequency 6 kHz; monolithic three axis high bandwidth nanopositioning stage; open loop feedforward control; parasitic motion minimization; three axis serial kinematic nanopositioning stage; vertical positioning range; video scanning probe microscopy; Atomic force microscopy; Bandwidth; Finite element methods; Mechanical engineering; Nanopositioning; Optical imaging; Prototypes; Resonance; Scanning probe microscopy; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2010
Conference_Location
Baltimore, MD
ISSN
0743-1619
Print_ISBN
978-1-4244-7426-4
Type
conf
DOI
10.1109/ACC.2010.5530933
Filename
5530933
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