DocumentCode :
3284250
Title :
Design, characterization, and control of a monolithic three-axis high-bandwidth nanopositioning stage
Author :
Kenton, B.J. ; Leang, K.K.
Author_Institution :
Mech. Eng. Dept., Univ. of Nevada-Reno, Reno, NV, USA
fYear :
2010
fDate :
June 30 2010-July 2 2010
Firstpage :
4949
Lastpage :
4956
Abstract :
A new three-axis serial-kinematic nanopositioning stage developed for high-bandwidth applications such as video-rate scanning probe microscopy (SPM) is presented. The stage employs uniquely designed compliant flexures for guiding the motion of the sample platform and to minimize parasitic motion (runout) and off-axis effects compared to previous designs. Finite element analysis (FEA) predicts the dominant resonances along the fast (x-axis) and slow (y-axis) scanning axes at 25.9 and 5.96 kHz, respectively. The performance of the nanopositioning stage is evaluated and the measured dominant resonances in the fast and slow scanning directions are 24.2 and 6.0 kHz, respectively, which are in good agreement with the FEA predictions. The lateral and vertical positioning range of the prototype stage is approximately 9 × 9 μm2 and 1 μm, respectively. Experimental atomic force microscope imaging and tracking results for closed- and open-loop feedforward control are presented to demonstrate the performance of the stage.
Keywords :
closed loop systems; feedforward; finite element analysis; instrumentation; open loop systems; scanning probe microscopy; closed loop feedforward control; designed compliant flexures; finite element analysis; force microscope imaging; frequency 24.2 kHz; frequency 6 kHz; monolithic three axis high bandwidth nanopositioning stage; open loop feedforward control; parasitic motion minimization; three axis serial kinematic nanopositioning stage; vertical positioning range; video scanning probe microscopy; Atomic force microscopy; Bandwidth; Finite element methods; Mechanical engineering; Nanopositioning; Optical imaging; Prototypes; Resonance; Scanning probe microscopy; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2010
Conference_Location :
Baltimore, MD
ISSN :
0743-1619
Print_ISBN :
978-1-4244-7426-4
Type :
conf
DOI :
10.1109/ACC.2010.5530933
Filename :
5530933
Link To Document :
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