Title :
Achieving 1/f noise reduction with the MEMS flux concentrator
Author :
Edelstein, Alan ; Fischer, Greg A. ; Burnette, James E. ; Egelhoff, William E., Jr. ; Cheng, Shu Fan
Author_Institution :
US Army Res. Lab., Adelphi, MD, USA
Abstract :
Though magnetic tunnel junctions (MTJ) with MgO barriers have magnetoresistance (MR) values as large as 400%, their usefulness as magnetic sensors at low frequencies is limited by 1/f noise. Here we present data showing that our device, the MEMS flux concentrator, does greatly decreases the problem of 1/f noise in magnetic sensors. The device has flux concentrators on MEMS structures that are driven to undergo oscillatory motion at their normal mode resonant frequencies. The motion of the flux concentrators increases the frequency of the field at the position of the sensor to 48 kHz where 1/f noise is much smaller. New modeling results of our recent design are a factor of 30 increase in the percentage of field modulation and a factor of 15 enhancement of the magnetic field. The new design features were using large, stationary flux concentrators that overlap smaller, moving flux concentrators and using the in phase normal mode. Sensors incorporating these features will be able to detect a few pT/Hz1/2 at 1 Hz.
Keywords :
1/f noise; magnetic flux; magnetic sensors; microsensors; spin valves; tunnelling magnetoresistance; 1/f noise reduction; MEMS flux concentrator; frequency 1 Hz; frequency 48 kHz; magnetic tunnel junctions; magnetoresistance; moving flux concentrators; normal mode resonant frequencies; oscillatory motion; phase normal mode; spin valve magnetic sensor; stationary flux concentrators; Acoustical engineering; Low-frequency noise; Magnetic modulators; Magnetic noise; Magnetic sensors; Magnetic tunneling; Micromechanical devices; Noise reduction; Resonant frequency; Tunneling magnetoresistance;
Conference_Titel :
Sensors, 2009 IEEE
Conference_Location :
Christchurch
Print_ISBN :
978-1-4244-4548-6
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2009.5398411