• DocumentCode
    3284474
  • Title

    Implications of SiO2 Breakdown in an Integrated Nanoscale Power Supply

  • Author

    Budnik, Mark M. ; Roy, Kaushik

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    268
  • Lastpage
    269
  • Keywords
    Breakdown voltage; Dielectric breakdown; Electric breakdown; MOSFETs; Microprocessors; Power supplies; Predictive models; Regulators; Temperature; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596088
  • Filename
    1596088
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3284474