• DocumentCode
    3284478
  • Title

    Performance tradeoffs of integrated CMOS charge amplifiers

  • Author

    Lopez-Martin, Antonio J. ; Massarotto, Marco ; Carlosena, Alfonso

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Public Univ. of Navarra, Pamplona, Spain
  • fYear
    2009
  • fDate
    25-28 Oct. 2009
  • Firstpage
    1345
  • Lastpage
    1348
  • Abstract
    A detailed comparison of integrated CMOS charge amplifiers is presented in this work. Conventional topologies, along with new ones, have been fabricated in a CMOS test chip prototype and their measured performance compared in terms of sensitivity, PSRR, and frequency response. As a result of this work, a complete library of fabricated CMOS charge amplifiers is presented and the performance tradeoffs of each solution discussed. This way the designer can make an educated choice about the design that best suits some given specs.
  • Keywords
    CMOS analogue integrated circuits; amplifiers; CMOS test chip prototype; PSRR; frequency response; integrated CMOS charge amplifiers; performance tradeoffs; sensitivity; CMOS technology; Charge measurement; Circuit topology; Current measurement; Force measurement; Frequency measurement; Radiation detectors; Semiconductor device measurement; Substrates; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2009 IEEE
  • Conference_Location
    Christchurch
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-4548-6
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2009.5398412
  • Filename
    5398412