Title :
Performance tradeoffs of integrated CMOS charge amplifiers
Author :
Lopez-Martin, Antonio J. ; Massarotto, Marco ; Carlosena, Alfonso
Author_Institution :
Dept. of Electr. & Electron. Eng., Public Univ. of Navarra, Pamplona, Spain
Abstract :
A detailed comparison of integrated CMOS charge amplifiers is presented in this work. Conventional topologies, along with new ones, have been fabricated in a CMOS test chip prototype and their measured performance compared in terms of sensitivity, PSRR, and frequency response. As a result of this work, a complete library of fabricated CMOS charge amplifiers is presented and the performance tradeoffs of each solution discussed. This way the designer can make an educated choice about the design that best suits some given specs.
Keywords :
CMOS analogue integrated circuits; amplifiers; CMOS test chip prototype; PSRR; frequency response; integrated CMOS charge amplifiers; performance tradeoffs; sensitivity; CMOS technology; Charge measurement; Circuit topology; Current measurement; Force measurement; Frequency measurement; Radiation detectors; Semiconductor device measurement; Substrates; Testing;
Conference_Titel :
Sensors, 2009 IEEE
Conference_Location :
Christchurch
Print_ISBN :
978-1-4244-4548-6
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2009.5398412