• DocumentCode
    3284591
  • Title

    The Reverse Leakage Current of Present-Day Manufactured Silicon PN Junctions and Their Maximum Permissible Operation Temperature

  • Author

    Obreja, Vasile V N

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    288
  • Lastpage
    289
  • Keywords
    Diodes; Displays; Leakage current; Manufacturing; Passivation; Research and development; Shape; Silicon; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596098
  • Filename
    1596098
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3284591