DocumentCode
3284671
Title
Characterization and Application of SiC TI-VJFETs
Author
Sheng, K. ; Lee, J.H. ; Alexandrov, P. ; Zhao, J.H.
fYear
2005
fDate
Dec. 7-9, 2005
Firstpage
296
Lastpage
297
Keywords
Circuit testing; JFETs; MOSFETs; Power electronics; Pulse measurements; Pulse width modulation inverters; Silicon carbide; Switches; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2005 International
Print_ISBN
1-4244-0083-X
Type
conf
DOI
10.1109/ISDRS.2005.1596102
Filename
1596102
Link To Document