DocumentCode :
3284671
Title :
Characterization and Application of SiC TI-VJFETs
Author :
Sheng, K. ; Lee, J.H. ; Alexandrov, P. ; Zhao, J.H.
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
296
Lastpage :
297
Keywords :
Circuit testing; JFETs; MOSFETs; Power electronics; Pulse measurements; Pulse width modulation inverters; Silicon carbide; Switches; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1596102
Filename :
1596102
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3284671
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