• DocumentCode
    3284774
  • Title

    Capacitance-Voltage Hysteresis Effects in Metal-SiO2-Thin Film Organic Semiconductor Devices

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    312
  • Lastpage
    313
  • Keywords
    Capacitance-voltage characteristics; Hysteresis; Organic semiconductors; Polarization; Semiconductor films; Semiconductor thin films; Temperature; Thermodynamics; Thin film devices; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596111
  • Filename
    1596111
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3284774