Title :
A W-band integrated silicon-germanium loop-back and front-end transmit-receive switch for Built-in-self-test
Author :
Schmid, Robert L. ; Song, Peter ; Coen, Christopher T. ; Ulusoy, Ahmet Cagri ; Cressler, John D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents a front-end switch that integrates the ability to provide both loop-back testing and transmit-receive operation. In addition, power detectors are integrated with capacitive couplers to sense the power levels at the transmitter output and the receiver input. The measured results show the power detectors have constant responsivity and can predict the power level within 0.5 dB. These capabilities are added to the front-end switch while maintaining an insertion loss of 2.3-2.5 dB and an isolation of 19.5 dB at 94 GHz.
Keywords :
Ge-Si alloys; built-in self test; microwave detectors; microwave switches; transceivers; W-band integrated silicon-germanium loop-back; built-in-self-test; capacitive couplers; frequency 94 GHz; front-end transmit-receive switch; loss 2.3 dB to 2.5 dB; power detectors; Antenna measurements; Detectors; Loss measurement; Power measurement; Receivers; Testing; Transmitters; SPDT; SiGe HBT; W-band; builtin-self-test; loop-back test; reverse saturation; silicon-germanium; switch;
Conference_Titel :
Microwave Symposium (IMS), 2015 IEEE MTT-S International
Conference_Location :
Phoenix, AZ
DOI :
10.1109/MWSYM.2015.7166811