مرکز منطقه ای اطلاع رساني علوم و فناوري - CMOS Device Reliability for Emerging Cryogenic Space Electronics Applications

DocumentCode :

3284896

Title :

CMOS Device Reliability for Emerging Cryogenic Space Electronics Applications

Author :

Chen, Tianbing ; Najafizadeh, Laleh ; Zhu, Chendong ; Ahmed, Adnan ; Diestelhorst, Ryan ; Espinel, Gustavo ; Cressler, John D.

fYear :

2005

fDate :

Dec. 7-9, 2005

Firstpage :

328

Lastpage :

329

Keywords :

Application software; CMOS technology; Circuits; Cryogenics; Degradation; Geometry; Hot carriers; Moon; Space technology; Temperature;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Semiconductor Device Research Symposium, 2005 International

Print_ISBN :

1-4244-0083-X

Type :

conf

DOI :

10.1109/ISDRS.2005.1596119

Filename :

1596119

Link To Document :