Title : 
Near-far resistance of linear receivers in chip asynchronous CDMA systems with random signatures
         
        
            Author : 
Saquib, Mohammad
         
        
            Author_Institution : 
Wireless Commun. Res. Lab., Texas Univ., Dallas, TX, USA
         
        
        
        
        
        
            Abstract : 
This paper examines the robustness of the linear receivers, such as the MMSE and the decorrelating receivers, against the near-far problem in chip asynchronous random DS/CDMA systems. In asynchronous CDMA systems, both of those linear receivers achieve the optimum near-far resistance by employing infinite-bit-long observation windows. We develop simple tight upper and lower bounds on the average optimum near-far resistance. It is shown that the average optimum near-far resistance of the asynchronous system is upper bounded by that of the synchronous system. These bounds converge to the average optimum near-far resistance of the synchronous system as the processing gain and the number of users approach infinity. A simulation study was performed to characterize the average optimum near-far resistance for finite processing gain systems
         
        
            Keywords : 
code division multiple access; decorrelation; least mean squares methods; radio receivers; CDMA systems; MMSE receiver; average optimum near-far resistance; chip asynchronous systems; decorrelating receiver; finite processing gain systems; infinite-bit-long observation windows; linear receivers; near-far resistance; random signatures; simulation study; tight lower bounds; tight upper bounds; Additive white noise; Decorrelation; H infinity control; Laboratories; Multiaccess communication; Performance gain; Power system modeling; Robustness; Upper bound; Wireless communication;
         
        
        
        
            Conference_Titel : 
Communications, 2001. ICC 2001. IEEE International Conference on
         
        
            Conference_Location : 
Helsinki
         
        
            Print_ISBN : 
0-7803-7097-1
         
        
        
            DOI : 
10.1109/ICC.2001.936650