DocumentCode
3285351
Title
Addressing the Metric Challenge: Evolved versus Traditional Fault Tolerant Circuits
Author
Haddow, Pauline C. ; Hartmann, Morten ; Djupdal, Asbjoern
Author_Institution
Norwegian Univ. of Sci. & Technol., Trondheim
fYear
2007
fDate
5-8 Aug. 2007
Firstpage
431
Lastpage
438
Abstract
The field of Evolvable Hardware, applying artificial evolution to the design of digital and analogue hardware is around ten years old. However, the field is far from reaching main stream electronics, although some few examples exist. One cause may be that the problems that are addressed in the field are, in general but not always, relatively simple designs which may be regarded as "toy problems", this work being no exception. Interest in the possibilities inherent in evolved designs is growing, as may be seen from the inclusion of evolvable hardware as a topic in a number of more traditional electronics conferences. However, how good are the designs that are evolved? How can they be compared to their traditional counterparts? Suitable metrics are needed which enable comparison between these two fields of design and that can provide an accurate and fair evaluation of the given design technique. In this work the issue of fault tolerance is addressed together with the design metric reliability.
Keywords
circuit reliability; fault tolerance; network synthesis; artificial evolution; design metric reliability; digital analogue hardware; evolvable hardware; fault tolerant circuits; Circuit faults; Circuit testing; Electronic circuits; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; NASA; Runtime; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Adaptive Hardware and Systems, 2007. AHS 2007. Second NASA/ESA Conference on
Conference_Location
Edinburgh
Print_ISBN
978-0-7695-2866-3
Type
conf
DOI
10.1109/AHS.2007.22
Filename
4291951
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