Performance bounds and measurements for AC-coupled direct-conversion transceivers under the presence of 1/f noise

Author

Georgiadis, Anthimos ; Point, Robert

Author_Institution

Global Commun. Devices, North Andover, MA, USA

fYear

2003

fDate

15-17 Oct. 2003

Firstpage

29

Lastpage

32

Abstract

Design considerations and trade-offs for AC-coupled direct-conversion transceivers that suffer from 1/f noise are explored. CMOS technology provides a cost-effective solution for RF direct-conversion applications, but it suffers from 1/f noise. Theoretical bounds and simulation results were complemented by error vector magnitude (EVM) measurements on a differential CMOS LNA and mixer. The results verified that the system performance is less sensitive to the AC-coupling corner frequency than the 1/f corner frequency. Moreover, simulations showed that the effect of the AC-coupling corner frequency is less significant for lower SNR.

Keywords

1/f noise; CMOS analogue integrated circuits; differential amplifiers; integrated circuit design; mixers (circuits); semiconductor device models; semiconductor device noise; transceivers; 1/f corner frequency; 1/f noise; AC-coupled direct-conversion transceivers; AC-coupling corner frequency; CMOS technology; EVM measurements; SNR; differential CMOS LNA; differential amplifiers; error vector magnitude measurements; mixer; semiconductor device modelling; CMOS technology; Colored noise; Degradation; Equalizers; Frequency; Intersymbol interference; Noise measurement; Signal to noise ratio; System performance; Transceivers;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless Communication Technology, 2003. IEEE Topical Conference on

Print_ISBN

0-7803-8196-3

Type

conf

DOI

10.1109/WCT.2003.1321429

Filename

1321429