RF front-end input modeling and de-embedding

Author

Proehl, Greg

Author_Institution

Consumer Bus. Unit-US Front End Products, STMicroelectronics, Inc, Schaumburg, IL, USA

fYear

2003

fDate

15-17 Oct. 2003

Firstpage

35

Lastpage

37

Abstract

The objective of the paper is to explain the process of satellite/cable/terrestrial front-end modeling and IC de-embedding using RF simulation software. A thorough process is demonstrated, including modeling the input connector, the 75 Ω impedance traces and lumped element matching, so that we obtain a reasonable estimate of the actual S-parameter model of a tuner IC at the RF input pin. Physical models are measured on a vector network analyzer (VNA), and S-parameters are obtained and compared to the simulated model. The modeled device under test includes an SMA, or F-type, connector, 75 Ω impedance traces, lumped element matching, and an RF IC input pin. The details of modeling errors, their impact on the model, and their resolutions are discussed.

Keywords

S-parameters; circuit simulation; circuit testing; microwave integrated circuits; F-type connector; IC de-embedding; RF front-end input modeling; RF simulation software; S-parameters; SMA connector; input connector; lumped element matching; microwave traces; tuner IC; vector network analyzer; Analytical models; Connectors; Impedance; Integrated circuit modeling; Integrated circuit testing; Radio frequency; Radiofrequency integrated circuits; Satellites; Scattering parameters; Tuners;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless Communication Technology, 2003. IEEE Topical Conference on

Print_ISBN

0-7803-8196-3

Type

conf

DOI

10.1109/WCT.2003.1321431

Filename

1321431