DocumentCode :
3285552
Title :
On Energy-Reliability Tradeoff in Analog-to-Digital Converters with Imperfect Comparators
Author :
Kakavand, Hossein ; El Gamal, Abbas
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA
fYear :
2006
fDate :
22-24 March 2006
Firstpage :
1366
Lastpage :
1371
Abstract :
The paper investigates the tradeoff between energy-per-conversion and comparator reliability for Flash, first order SigmaDelta, and Beta expansion analog-to-digital converter architectures. Upper bounds on the minimum number of index bits required to achieve a prescribed distortion are derived as a function of comparator reliability. These bounds are then combined with a comparator energy-per-comparison-reliability relation to provide upper bounds on the energy-per-conversion for each architecture. The upper bounds are found to be monotonically increasing in reliability, suggesting that it is better from an energy-per-conversion perspective to use relatively unreliable comparators.
Keywords :
circuit reliability; comparators (circuits); distortion; sigma-delta modulation; Beta expansion; analog-to-digital converter architecture; comparator reliability; distortion; energy-per-conversion; first order SigmaDelta; Analog-digital conversion; Binary sequences; Circuit noise; Converters; Decoding; Digital circuits; Energy consumption; Energy resolution; Quantization; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Sciences and Systems, 2006 40th Annual Conference on
Conference_Location :
Princeton, NJ
Print_ISBN :
1-4244-0349-9
Electronic_ISBN :
1-4244-0350-2
Type :
conf
DOI :
10.1109/CISS.2006.286678
Filename :
4068019
Link To Document :
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