Title :
Piezoelectric enhancement of relaxor-based lead-free piezoelectric ceramics by nanodomain engineering
Author :
Fujii, Ichiro ; Mitsui, Ryuta ; Nakashima, Kouichi ; Kumada, Nobuhiro ; Wada, Satoshi ; Yabuta, Hisato ; Shimada, Mikio ; Watanabe, Takayuki ; Miura, Kaoru
Author_Institution :
Interdiscipl. Grad. Sch. of Med. & Eng., Univ. of Yamanashi, Yamanashi, Japan
Abstract :
0.3BaTiO3-0.1Bi(Mg1/2Ti1/2)O3-0.6BiFeO3 ceramics were either doped with vanadium or sintered in calcined powder with the same composition. Compared to an undoped ceramic sintered without the calcined powder, both ceramics showed reduced leakage current densities (lower than 1 × 10-7 A/cm2) and absence of dielectric relaxation behaviors observed in frequency-and temperature-dependent dielectric measurements. The Curie temperatures of both samples were higher than 460 °C. The maximum field-induced strain over the applied field, Smax/Emax, of 366 pm/V of the undoped ceramic sintered without the calcined powder increased to 455 and 799 pm/V for the V-doped sample and the sample sintered with the calcined powder, respectively. The increase was related to a reduced concentration of bismuth vacancy - oxygen vacancy defect dipoles.
Keywords :
Curie temperature; barium compounds; bismuth compounds; calcination; current density; dielectric relaxation; leakage currents; magnesium compounds; piezoceramics; piezoelectricity; sintering; vacancies (crystal); vanadium; BaTiO3-Bi(Mg0.5Ti0.5)O3-BiFeO3:V; Curie temperatures; bismuth vacancy-oxygen vacancy defect dipoles; calcined powder; dielectric relaxation; frequency-dependent dielectric measurement; maximum field-induced strain; nanodomain engineering; piezoelectricity; reduced leakage current density; relaxor-based lead-free piezoelectric ceramics; sintering; temperature-dependent dielectric measurement; Ceramics; Dielectric measurements; Dielectrics; Electric fields; Leakage current; Powders; Temperature measurement; ceramics; lead-free; nanodomain; piezoeletrics; relaxor;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297767