DocumentCode :
3286164
Title :
SVMs and data dependent distance metric
Author :
Zaidi, N. ; Squire, D.
Author_Institution :
Clayton Sch. of Inf. Technol., Monash Univ., Clayton, VIC, Australia
fYear :
2010
fDate :
8-9 Nov. 2010
Firstpage :
1
Lastpage :
7
Abstract :
Support Vector Machine (SVM) is an efficient classification tool. Based on the principle of structured risk minimization, SVM is designed to generalize well. But it has been shown that SVM is not immune to the curse of dimensionality. Also SVM performance is not only critical to the choice of kernel but also to the kernel parameters which are generally tuned through computationally expensive cross-validation procedures. Typical kernels do not have any information about the subspace to ignore irrelevant features or making relevant features explicit. Recently, a lot of progress has been made for learning a data dependent distance metric for improving the efficiency of k-Nearest Neighbor (KNN) classifier. Metric learning approaches have not been investigated in the context of SVM. In this paper, we study the impact of learning a data dependent distance metric on classification performance of an SVM classifier. Our novel approach in this paper is a formulation relying on a simple Mean Square Error (MSE) gradient based metric learning method to tune kernel´s parameters. Experiments are conducted on major UCIML, faces and digit databases. We have found that tuning kernel parameters through a metric learning approach can improve the classification performance of an SVM classifier.
Keywords :
learning (artificial intelligence); object recognition; pattern classification; support vector machines; SVM; data dependent distance metric; efficient classification tool; k-nearest neighbor classifier; kernel parameters; mean square error gradient based metric learning; metric learning approaches; object recognition; structured risk minimization; support vector machine; Classification algorithms; Kernel; Measurement; Support vector machines; Training; Training data; Gaussian kernel tuning; local methods; metric learning; object recognition; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Vision Computing New Zealand (IVCNZ), 2010 25th International Conference of
Conference_Location :
Queenstown
ISSN :
2151-2191
Print_ISBN :
978-1-4244-9629-7
Type :
conf
DOI :
10.1109/IVCNZ.2010.6148826
Filename :
6148826
Link To Document :
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