• DocumentCode
    3286222
  • Title

    Mesh refinement strategies for capacitance extraction based on residual errors

  • Author

    Tausch, J. ; White, Jonathan

  • Author_Institution
    Res. Lab. of Electron., MIT, Cambridge, MA
  • fYear
    1996
  • fDate
    28-30 Oct 1996
  • Firstpage
    236
  • Lastpage
    237
  • Abstract
    We investigate mesh generation for capacitance calculations. The refinement scheme is controlled by an error estimator based on the residual of the solution calculated on a coarse grid. Numerical experiments are presented. The surface gradient of the residual provides a mean to estimate the discretization error. The grids produced by our algorithm allow accurate estimates of the capacitance with significantly fewer panels than uniform discretizations. Adaptive procedures that minimize the discretization in other norms, like the energy norm, could result in even better grids
  • Keywords
    capacitance; conductors (electric); integral equations; mesh generation; capacitance extraction; coarse grid; discretization error; energy norm; error estimator; mesh refinement strategies; residual errors; surface gradient;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1996., IEEE 5th Topical Meeting
  • Conference_Location
    Napa, CA
  • Print_ISBN
    0-7803-3514-7
  • Type

    conf

  • DOI
    10.1109/EPEP.1996.564842
  • Filename
    564842