Title :
Mesh refinement strategies for capacitance extraction based on residual errors
Author :
Tausch, J. ; White, Jonathan
Author_Institution :
Res. Lab. of Electron., MIT, Cambridge, MA
Abstract :
We investigate mesh generation for capacitance calculations. The refinement scheme is controlled by an error estimator based on the residual of the solution calculated on a coarse grid. Numerical experiments are presented. The surface gradient of the residual provides a mean to estimate the discretization error. The grids produced by our algorithm allow accurate estimates of the capacitance with significantly fewer panels than uniform discretizations. Adaptive procedures that minimize the discretization in other norms, like the energy norm, could result in even better grids
Keywords :
capacitance; conductors (electric); integral equations; mesh generation; capacitance extraction; coarse grid; discretization error; energy norm; error estimator; mesh refinement strategies; residual errors; surface gradient;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1996., IEEE 5th Topical Meeting
Conference_Location :
Napa, CA
Print_ISBN :
0-7803-3514-7
DOI :
10.1109/EPEP.1996.564842