Title :
Evaluation of Quality Attribute Variability in Software Product Families
Author :
Etxeberria, Leire ; Sagardui, Goiuria
Author_Institution :
Univ. of Mondragon, Mondragon
fDate :
March 31 2008-April 4 2008
Abstract :
Software product family or line is a software engineering paradigm that systematizes reuse. In software product line engineering, two phases are distinguished: domain engineering which is in charge of developing a common infrastructure and assets and application engineering which makes use of those assets to generate the products. One of the key aspects of product lines is variability and its management. However, the main focus has been on functional variability and quality variability in software product lines has not received so much attention by researchers. In a product line different members of the line may require different levels of a quality requirement, for instance they could differ in terms of their availability, security, reliability, etc. Due to this variability, quality evaluation in software product lines is much more complicated that in single-systems. One alternative is to evaluate all the products of a line but it is very expensive and ways of reducing evaluation efforts are necessary. In this direction, the paper presents a method for facilitating cost-effective quality evaluation of a product line taking into consideration variability on quality attributes.
Keywords :
DP industry; software quality; software reusability; application engineering; cost-effective quality evaluation; domain engineering; functional variability; quality attribute variability; quality requirement; quality variability; software product family; software product line engineering; software reuse; Computer architecture; Computer science; Conferences; Costs; Embedded system; Programmable logic arrays; Security; Software architecture; Software engineering; Software quality; Software product lines; evaluation; quality attributes; variability;
Conference_Titel :
Engineering of Computer Based Systems, 2008. ECBS 2008. 15th Annual IEEE International Conference and Workshop on the
Conference_Location :
Belfast
Print_ISBN :
0-7695-3141-5
DOI :
10.1109/ECBS.2008.14