Title :
Product pattern-based camera calibration for microrobotics
Author :
Pieters, R.S. ; Jonker, P.P. ; Nijmeijer, H.
Author_Institution :
Dept. of Mech. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
Abstract :
Traditional macro camera calibration techniques use multiple images at multiple orientations to obtain the camera´s internal and external calibration parameters. Microscopic camera calibration differs in this by limiting to only one image at fixed orientation (parallel to the image plane) and requiring a special calibration pattern. We propose a method to use the repetitive product pattern as calibration object. A parametric model of an optical microscope validates this approach by comparing the results from the product pattern with an industrial high-accuracy calibration pattern.
Keywords :
calibration; cameras; microrobots; robot vision; visual servoing; camera external calibration parameter; camera internal calibration parameter; image plane; industrial high-accuracy calibration pattern; macrocamera calibration technique; microrobotics; microscopic camera calibration; optical microscope; product pattern-based camera calibration; repetitive product pattern; Calibration; Cameras; Distortion measurement; Microscopy; Optics; Organic light emitting diodes; Substrates; Camera calibration; image processing; microrobotics; product as calibration pattern; visual servoing;
Conference_Titel :
Image and Vision Computing New Zealand (IVCNZ), 2010 25th International Conference of
Conference_Location :
Queenstown
Print_ISBN :
978-1-4244-9629-7
DOI :
10.1109/IVCNZ.2010.6148839