DocumentCode :
3286449
Title :
A 3D profile simulator for inclined/multi-directional UV lithography process of negative-tone thick photoresists
Author :
Zhu, Zhen ; Huang, Qing-An ; Li, Wei-Hua ; Zhou, Zai-Fa
Author_Institution :
Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
fYear :
2009
fDate :
25-28 Oct. 2009
Firstpage :
57
Lastpage :
60
Abstract :
A three-dimensional (3D) profile simulator that integrates aerial image module, exposure module, post-exposure bake (PEB) module and development module is presented in this paper for the inclined/multi-directional ultraviolet (UV) lithography of negative thick photoresist such as SU-8. Based on the scalar diffraction theory, the improved paraxial approximation and Fresnel approximation solutions are developed to simulate the inclined UV light intensity distribution into photoresist with the refraction, the absorption of SU-8 and the reflection at substrate surface incorporated effectively. A 3D dynamic cellular automate method for photoresist etching simulation is improved to calculate the final development patterns efficiently and accurately. The 3D profiles of oblique developed photoresist with or without reflection-induced structures as well as multi-directional-exposure structures are successfully predicted by this simulator, which demonstrate good agreement with the experimental results.
Keywords :
Fresnel diffraction; cellular automata; micromechanical devices; photoresists; ultraviolet lithography; 3D dynamic cellular automate method; 3D profile simulator; Fresnel approximation; MEMS; PEB module; SU-8; aerial image module; exposure module; inclined UV light intensity distribution; inclined/multi-directional UV lithography; micro-electromechanical systems; multi-directional-exposure structures; negative-tone thick photoresists; paraxial approximation; photoresist etching simulation; post-exposure bake module; reflection-induced structures; scalar diffraction theory; substrate surface; Diffraction; Etching; Fresnel reflection; Lithography; Micromechanical devices; Microstructure; Optical reflection; Optical refraction; Predictive models; Resists;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2009 IEEE
Conference_Location :
Christchurch
ISSN :
1930-0395
Print_ISBN :
978-1-4244-4548-6
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2009.5398530
Filename :
5398530
Link To Document :
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