DocumentCode
3286449
Title
A 3D profile simulator for inclined/multi-directional UV lithography process of negative-tone thick photoresists
Author
Zhu, Zhen ; Huang, Qing-An ; Li, Wei-Hua ; Zhou, Zai-Fa
Author_Institution
Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
fYear
2009
fDate
25-28 Oct. 2009
Firstpage
57
Lastpage
60
Abstract
A three-dimensional (3D) profile simulator that integrates aerial image module, exposure module, post-exposure bake (PEB) module and development module is presented in this paper for the inclined/multi-directional ultraviolet (UV) lithography of negative thick photoresist such as SU-8. Based on the scalar diffraction theory, the improved paraxial approximation and Fresnel approximation solutions are developed to simulate the inclined UV light intensity distribution into photoresist with the refraction, the absorption of SU-8 and the reflection at substrate surface incorporated effectively. A 3D dynamic cellular automate method for photoresist etching simulation is improved to calculate the final development patterns efficiently and accurately. The 3D profiles of oblique developed photoresist with or without reflection-induced structures as well as multi-directional-exposure structures are successfully predicted by this simulator, which demonstrate good agreement with the experimental results.
Keywords
Fresnel diffraction; cellular automata; micromechanical devices; photoresists; ultraviolet lithography; 3D dynamic cellular automate method; 3D profile simulator; Fresnel approximation; MEMS; PEB module; SU-8; aerial image module; exposure module; inclined UV light intensity distribution; inclined/multi-directional UV lithography; micro-electromechanical systems; multi-directional-exposure structures; negative-tone thick photoresists; paraxial approximation; photoresist etching simulation; post-exposure bake module; reflection-induced structures; scalar diffraction theory; substrate surface; Diffraction; Etching; Fresnel reflection; Lithography; Micromechanical devices; Microstructure; Optical reflection; Optical refraction; Predictive models; Resists;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2009 IEEE
Conference_Location
Christchurch
ISSN
1930-0395
Print_ISBN
978-1-4244-4548-6
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2009.5398530
Filename
5398530
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