• DocumentCode
    3286449
  • Title

    A 3D profile simulator for inclined/multi-directional UV lithography process of negative-tone thick photoresists

  • Author

    Zhu, Zhen ; Huang, Qing-An ; Li, Wei-Hua ; Zhou, Zai-Fa

  • Author_Institution
    Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
  • fYear
    2009
  • fDate
    25-28 Oct. 2009
  • Firstpage
    57
  • Lastpage
    60
  • Abstract
    A three-dimensional (3D) profile simulator that integrates aerial image module, exposure module, post-exposure bake (PEB) module and development module is presented in this paper for the inclined/multi-directional ultraviolet (UV) lithography of negative thick photoresist such as SU-8. Based on the scalar diffraction theory, the improved paraxial approximation and Fresnel approximation solutions are developed to simulate the inclined UV light intensity distribution into photoresist with the refraction, the absorption of SU-8 and the reflection at substrate surface incorporated effectively. A 3D dynamic cellular automate method for photoresist etching simulation is improved to calculate the final development patterns efficiently and accurately. The 3D profiles of oblique developed photoresist with or without reflection-induced structures as well as multi-directional-exposure structures are successfully predicted by this simulator, which demonstrate good agreement with the experimental results.
  • Keywords
    Fresnel diffraction; cellular automata; micromechanical devices; photoresists; ultraviolet lithography; 3D dynamic cellular automate method; 3D profile simulator; Fresnel approximation; MEMS; PEB module; SU-8; aerial image module; exposure module; inclined UV light intensity distribution; inclined/multi-directional UV lithography; micro-electromechanical systems; multi-directional-exposure structures; negative-tone thick photoresists; paraxial approximation; photoresist etching simulation; post-exposure bake module; reflection-induced structures; scalar diffraction theory; substrate surface; Diffraction; Etching; Fresnel reflection; Lithography; Micromechanical devices; Microstructure; Optical reflection; Optical refraction; Predictive models; Resists;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2009 IEEE
  • Conference_Location
    Christchurch
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-4548-6
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2009.5398530
  • Filename
    5398530