Title :
Measurement And Modeling Of MOS Transistor Current Mismatch In Analog IC´s
Author :
Felt, Eric ; Narayan, Amit ; Sangiovanni-Vlncentelli, A.
Keywords :
Analog integrated circuits; Current measurement; Data mining; Electric variables measurement; Integrated circuit modeling; Integrated circuit technology; MOSFETs; Permission; Semiconductor device modeling; Semiconductor process modeling;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629779
