Title :
Microstructure and impedance analysis of CaBi4Ti4O15 piezoceramics with (LiCe)-modifications
Author :
Peng, Zhihang ; Huang, Fengkang ; Chen, Qiang ; Bao, Shaoming ; Wang, Xiaoxiao ; Xiao, Dinquan ; Zhu, Jianguo
Author_Institution :
Coll. of Mater. Sci. & Eng., Sichuan Univ., Chengdu, China
Abstract :
(Li, Ce) doped CaBi4Ti4O15 (CBT) ceramics were prepared using the conventional solid state method. The crystal structure and microstructure of CBT-based ceramics were determined by the X-ray diffraction and scanning electron microscopy. It was found that the (Li, Ce) ions diffused into the A site of pseudo-perovskite structure and formed single Aurivillius type structure. The Curie-temperature (TC) of CBT ceramics decreased whereas the piezoelectric coefficient (d33) was improved with the increasing of (Li, Ce) dopants. Furthermore, the impedance spectrum techniques were invoked to understand the electrical properties for pure or modified-CBT compounds at high temperature region and the underlying physical mechanism were also discussed.
Keywords :
X-ray diffraction; bismuth compounds; calcium compounds; cerium; crystal microstructure; crystal structure; diffusion; ferroelectric Curie temperature; lithium; piezoceramics; piezoelectricity; scanning electron microscopy; CBT ceramics; CBT-based ceramics; CaBi4Ti4O15:Li,Ce; Curie-temperature; X-ray diffraction; aurivillius type structure; conventional solid state method; crystal structure; dopants; doping; electrical properties; high temperature region; impedance analysis; impedance spectrum techniques; ion diffusion; microstructural analysis; modified-CBT compounds; physical mechanism; piezoceramics; piezoelectric coefficient; pseudo-perovskite structure; scanning electron microscopy; Bismuth; Ceramics; Dielectrics; Impedance; Temperature; Temperature measurement; Aurivillius type materials; CaBi4Ti4O15; impedance; piezoelectric ceramics;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297791