Title :
Resistive switching in Sr1−0.05La0.05TiO3
Author :
Pilch, M. ; Szot, K.
Author_Institution :
Inst. of Phys., Univ. of Silesia, Katowice, Poland
Abstract :
The analysis of the electronic structure of La doped SrTiO3 single crystals, Sr1-xLaxTiO3 with x=5 at % (SLTO), shows that additional electrons in the host matrix are accommodated by a change of the valence of Ti ions from Ti+4 to Ti+3. We found, however, no evidence of a metallic peak near the Fermi level by electron spectroscopy. Similarly, electrical characterisation of the material revealed only semiconducting behaviour. This stands in contrast to the general idea of a macroscopic insulator-to-metal transition in SLTO at a doping level of a few percent of La. By means of conducting AFM we found evidence of an inhomogeneity of the in plane conductivity at the nano-scale and the possibility of locally manipulating the electric resistivity by means of an electrical stimuli, i.e. resistive switching. The observed inhomogeneity is attributed to a non-uniform distribution of La doping and a high density of extended defects in SLTO crystal.
Keywords :
Fermi level; atomic force microscopy; crystal structure; doping profiles; electrical conductivity; electrical resistivity; electron spectra; lanthanum; metal-insulator transition; semiconductor doping; semiconductor materials; strontium compounds; switching; AFM; Fermi level; Sr1-0.05La0.05TiO3; atomic force microscopy; defect density; doping level; electric resistivity; electrical characterisation; electron spectroscopy; electronic structure; in-plane conductivity; insulator-metal transition; resistive switching; semiconducting behaviour; single crystals; Conductivity; Crystals; Doping; Ions; Periodic structures; Switches; AFM; Strontium titanate; XPS; resistive switching;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297814