DocumentCode
3286884
Title
Simulation study of some goodness-or-fit tests properties
Author
Lemeshko, B.Y. ; Rogozhnikov, A.P.
Volume
01
fYear
2008
fDate
23-25 Sept. 2008
Firstpage
198
Lastpage
198
Abstract
Summary form only given. Advantages and disadvantages are studied, and powers are estimated for several goodness-of-fit tests for the normal distribution (tests by Frozini, Hegazy and Green, Spiegelhalter, Geary, and David, Hartley, and Pearson). Comparison is made with Shapiro-Wilk and Epps-Pulley tests.
Keywords
normal distribution; Epps-Pulley tests; Shapiro-Wilk tests; goodness-or-fit tests properties; normal distribution; Equations; Least squares methods; Parameter estimation; Power system modeling; Predictive models; Probability distribution; Random variables; Robustness; Statistical analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Instrument Engineering, 2008. APEIE 2008. 9th International Conference on Actual Problems of
Conference_Location
Novosibirsk
Print_ISBN
978-1-4244-2825-0
Type
conf
DOI
10.1109/APEIE.2008.4897176
Filename
4897176
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