Title :
Simple Free-Space Method for Measurement of Dielectric Constant by Means of Diffractive Optics with New Capabilities
Author :
Minin, I.V. ; Minin, O.V. ; Golodnikov, D.O.
Author_Institution :
Novosibirsk State Tech. Univ., Novosibirsk
Abstract :
The monitoring of the composition of materials is an important problem of applied spectroscopy using optical, infrared, microwave and THz wavelength bands. MM and THz waves ensure better spatial resolution than microwaves and they can be used for material testing in media that are opaque for optical and infrared radiation. Whenever dielectric components are used in MM and THz wavebands, a precise knowledge of the dielectric properties of the material is essential. The developments original setups for dielectric material probing simultaneously at several discrete wavelengths within the same local zone are described.
Keywords :
dielectric materials; materials testing; permittivity measurement; applied spectroscopy; dielectric constant measurement; dielectric material probing; diffractive optics; material testing; simple free space method; spatial resolution; Composite materials; Dielectric constant; Dielectric materials; Dielectric measurements; Infrared spectra; Monitoring; Optical diffraction; Optical materials; Spectroscopy; Wavelength measurement; diffractive optics; millimeter waves; moisture monitoring;
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk
Print_ISBN :
5-7782-0662-3
DOI :
10.1109/APEIE.2006.4292375
