Simple Free-Space Method for Measurement of Dielectric Constant by Means of Diffractive Optics with New Capabilities

Author

Minin, I.V. ; Minin, O.V. ; Golodnikov, D.O.

Author_Institution

Novosibirsk State Tech. Univ., Novosibirsk

fYear

2006

fDate

26-28 Sept. 2006

Firstpage

13

Lastpage

18

Abstract

The monitoring of the composition of materials is an important problem of applied spectroscopy using optical, infrared, microwave and THz wavelength bands. MM and THz waves ensure better spatial resolution than microwaves and they can be used for material testing in media that are opaque for optical and infrared radiation. Whenever dielectric components are used in MM and THz wavebands, a precise knowledge of the dielectric properties of the material is essential. The developments original setups for dielectric material probing simultaneously at several discrete wavelengths within the same local zone are described.

Keywords

dielectric materials; materials testing; permittivity measurement; applied spectroscopy; dielectric constant measurement; dielectric material probing; diffractive optics; material testing; simple free space method; spatial resolution; Composite materials; Dielectric constant; Dielectric materials; Dielectric measurements; Infrared spectra; Monitoring; Optical diffraction; Optical materials; Spectroscopy; Wavelength measurement; diffractive optics; millimeter waves; moisture monitoring;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of

Conference_Location

Novosibirsk

Print_ISBN

5-7782-0662-3

Type

conf

DOI

10.1109/APEIE.2006.4292375

Filename

4292375