DocumentCode :
3287226
Title :
The Solving Methods of Storing Data Lost in Testing System at the Power Breaking Off Time
Author :
Huixin, Zhang ; Kerui, Wu ; Wenyi, Liu
Author_Institution :
Nat. Key Lab. For Electron. Meas. Technol., North Univ. of China, Taiyuan, China
Volume :
3
fYear :
2009
fDate :
15-17 May 2009
Firstpage :
675
Lastpage :
677
Abstract :
This paper summarizes the traditional storing and testing methods in the first place. Brings forward the mostly used memory mode of data mixing edit frame and data separately edit frame. Illuminates the problem of data lost at power off time in each storing method. Then several solving methods aiming at the data losing situation of testing system at the power breaking off time are brought forward. Then analyzes the strongpoint and disadvantage of every method. In actual using process, we may choose the appropriate one according to the using environment and the memory medium. Carrying out the comparing and analyzing to the results of every storing method, the paper finally gives out the using conclusion, offers the consulting information for correlative specialties.
Keywords :
information storage; data storage; memory mode; power breaking off time; Centralized control; Circuit testing; Computer buffers; Electronic equipment testing; Flash memory; Frequency; Information technology; Logic; Power supplies; System testing; compare; lose; storage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology and Applications, 2009. IFITA '09. International Forum on
Conference_Location :
Chengdu
Print_ISBN :
978-0-7695-3600-2
Type :
conf
DOI :
10.1109/IFITA.2009.20
Filename :
5232216
Link To Document :
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