Title :
A SPICE simulation model for field emission triode
Author :
Lu, Chih-Wen ; Lee, Chung Len ; Huang, J.M.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model
Keywords :
SPICE; electron field emission; triodes; vacuum microelectronics; Fowler-Nordheim current density-field characteristics; SPICE simulation model; field emission triode; tip surface charge distribution; Anodes; Cathodes; Circuit simulation; Diodes; Equivalent circuits; FETs; Microelectronics; SPICE; Solid modeling; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location :
St. Petersburg
Print_ISBN :
0-7803-3594-5
DOI :
10.1109/IVMC.1996.601774
