DocumentCode
3287636
Title
Investigations of dielectric and ferroelectric properties of yttrium substituted SrBi2 Ta2 O9 ferroelectric ceramics: Investigations of yttrium substituted SBT ferroelectric ceramics
Author
Sugandha ; Jha, A.K.
Author_Institution
Dept. of Appl. Phys., Delhi Technol. Univ., Delhi, India
fYear
2012
fDate
9-13 July 2012
Firstpage
1
Lastpage
8
Abstract
In the present work yttrium substituted samples of compositions Sr1-xYxBi2Ta2O9 (x=0.0-0.1) were synthesized by solid state reaction method. The synthesized specimens were characterized for their structural and electrical properties. X-ray diffractograms of the samples reveal the single phase layered perovskite structure formation for yttrium content x ≤ 0.05. The temperature variation of dielectric constant shows that the Curie temperature (Tc) decreases on increasing the yttrium concentration. The dielectric loss reduces significantly with yttrium substitution. The ferroelectric properties improve with Y substitution and the maximum value of remnant polarization is observed for the composition with x =0.05. The observations have been discussed in terms of contribution from the cation vacancies introduced into the lattice structure due to donor substitution.
Keywords
X-ray diffraction; bismuth compounds; crystal structure; dielectric losses; dielectric polarisation; ferroelectric Curie temperature; ferroelectric ceramics; permittivity; strontium compounds; vacancies (crystal); yttrium compounds; Curie temperature; Sr1-xYxBi2Ta2O9; X-ray diffractograms; cation vacancies; dielectric constant; dielectric loss; dielectric properties; electrical properties; ferroelectric ceramics; ferroelectric properties; lattice structure; remnant polarization; single phase layered perovskite structure; solid state reaction method; structural properties; Bismuth; Compounds; Dielectric constant; Dielectric losses; Temperature; Yttrium; Dielectric property; Ferroelectric property; Y substituted SBT; c Electroceramics;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location
Aveiro
Print_ISBN
978-1-4673-2668-1
Type
conf
DOI
10.1109/ISAF.2012.6297863
Filename
6297863
Link To Document