Title :
Eye prediction of digital driver with power distribution network noise
Author :
Chiu-Chih Chou ; Hao-Hsiang Chuang ; Tzong-Lin Wu ; Shih-Hung Weng ; Chung-kuan Cheng
Author_Institution :
Grad. Inst. of Commun. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.
Keywords :
circuit noise; circuit testing; driver circuits; HSPICE simulation; PDN; PRBS; SMBP; channel design; circuit testing; digital driver; eye prediction; nonlinear I-O circuit; nonlinearity circuit; power distribution network noise; superposition of multiple bit pattern response; time-consuming random bit simulation; worst-case eye diagram estimation; Accuracy; Algorithm design and analysis; Estimation; Integrated circuit modeling; Power systems; Prediction algorithms; RLC circuits; eye diagram; multiple bit pattern response; nonlinear effect; power distribution network; worst case estimation algorithm;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457859