Title :
Device SEE susceptibility from heavy ions (1995-1996)
Author :
Nichols, D.K. ; Coss, J.R. ; Miyahira, T.F. ; Schwartz, H.R. ; Swift, G.M. ; Koga, R. ; Crain, W.R. ; Crawford, K.B. ; Penzin, S.H.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs
Keywords :
integrated circuit testing; ion beam effects; IC functional classes; IEEE publications; device SEE susceptibility; heavy ions; latchup response; single event effects; test data set; Aerospace testing; Conferences; IEEE publications; Ion beams; Laboratories; Manufacturing processes; Propulsion; Pulp manufacturing; Space technology; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 1997 IEEE
Conference_Location :
Snowmass Village, CO
Print_ISBN :
0-7803-4061-2
DOI :
10.1109/REDW.1997.629790
