Title :
Single event effect test results for candidate spacecraft electronics
Author :
LaBel, Kenneth A. ; Moran, Amy K. ; Seidleck, Christina M. ; Stassinopoulos, E.G. ; Barth, Janet M. ; Marshall, Paul ; Carts, Martin ; Marshall, Cheryl ; Kinnison, James ; Carkhuff, Bliss
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links
Keywords :
analogue integrated circuits; digital integrated circuits; ion beam effects; optical fibre communication; optical fibres; proton effects; space vehicle electronics; DRAMs; FPGAs; analog ICs; candidate spacecraft electronics; digital ICs; fiber links; fiber optic devices; ground test results; heavy ion effect; proton effect; single event effect test results; Aerospace electronics; Cyclotrons; Electronic equipment testing; Field programmable gate arrays; NASA; Performance evaluation; Protons; Random access memory; Single event upset; Space vehicles;
Conference_Titel :
Radiation Effects Data Workshop, 1997 IEEE
Conference_Location :
Snowmass Village, CO
Print_ISBN :
0-7803-4061-2
DOI :
10.1109/REDW.1997.629791
