DocumentCode
3287797
Title
Single event effect test results for candidate spacecraft electronics
Author
LaBel, Kenneth A. ; Moran, Amy K. ; Seidleck, Christina M. ; Stassinopoulos, E.G. ; Barth, Janet M. ; Marshall, Paul ; Carts, Martin ; Marshall, Cheryl ; Kinnison, James ; Carkhuff, Bliss
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
1997
fDate
35635
Firstpage
14
Lastpage
21
Abstract
We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links
Keywords
analogue integrated circuits; digital integrated circuits; ion beam effects; optical fibre communication; optical fibres; proton effects; space vehicle electronics; DRAMs; FPGAs; analog ICs; candidate spacecraft electronics; digital ICs; fiber links; fiber optic devices; ground test results; heavy ion effect; proton effect; single event effect test results; Aerospace electronics; Cyclotrons; Electronic equipment testing; Field programmable gate arrays; NASA; Performance evaluation; Protons; Random access memory; Single event upset; Space vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1997 IEEE
Conference_Location
Snowmass Village, CO
Print_ISBN
0-7803-4061-2
Type
conf
DOI
10.1109/REDW.1997.629791
Filename
629791
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