DocumentCode
32878
Title
Benzo-cyclo-butene bonding process with ´stamp´ printing for wafer level package
Author
Wen Xia ; Lei Li ; Kangfa Deng ; Song Li ; Weiguo Su ; Wei Zhang
Author_Institution
Nat. Key Lab. of Micro/Nano Fabrication Technol., Inst. of Microelectron., Beijing, China
Volume
9
Issue
5
fYear
2014
fDate
May-14
Firstpage
363
Lastpage
366
Abstract
Presented is a novel process of benzo-cyclo-butene (BCB) bonding for a wafer level package with `stamp´ printing, in which the BCB structure is transferred and patterned by pressing the cap wafer towards another wafer with a liquid BCB layer. Compared with the conventional BCB bonding process, this new method not only avoids the residual polymer inside the cavity to extend the application of BCB bonding in the complex three-dimensional structures but also raises the bonding strength because of the non-treatment before bonding. The key process parameters, such as the auxiliary wafer material, pre-curing time and bonding pressure were optimised after a series of contrast experiments. The bonding quality was evaluated qualitatively by manual separation and quantitatively by a tensile bonding test. This new method has a minimum bonding strength of 5.9 MPa, which is more than ten times the conventional one. Besides, the bonding yield reaches 80% in five groups of 4-inch wafers. Finally, this process was successfully utilised in an acceleration microswitch.
Keywords
curing; microswitches; organic compounds; tensile testing; wafer bonding; wafer level packaging; acceleration microswitch; auxiliary wafer material; benzo-cyclo-butene bonding process; bonding quality; bonding strength; precuring time; stamp printing; tensile bonding test; three-dimensional structures; wafer level package;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2014.0137
Filename
6824510
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