DocumentCode
3287986
Title
Radiation testing results of COTS based space microcircuits
Author
Layton, P. ; Strobel, David ; Anthony, Hal ; Boss, Robert ; Marshall, Jim ; Parkinson, John ; Spratt, Jim ; Passenheim, Burr
Author_Institution
Space Electron. Inc., San Diego, CA, USA
fYear
1997
fDate
35635
Firstpage
22
Lastpage
27
Abstract
We present both heavy ion single event effect (SEE) and total ionizing dose (TID) data collected at Space Electronics Inc. for candidate spacecraft microelectronics
Keywords
failure analysis; integrated circuit reliability; integrated circuit testing; ion beam effects; space vehicle electronics; COTS; heavy ion single event effect; radiation testing; space microcircuits; spacecraft microelectronics; total ionizing dose; Aerospace electronics; Cobalt; Cyclotrons; Dosimetry; Electronic equipment testing; Field programmable gate arrays; Integrated circuit testing; Laboratories; Microelectronics; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1997 IEEE
Conference_Location
Snowmass Village, CO
Print_ISBN
0-7803-4061-2
Type
conf
DOI
10.1109/REDW.1997.629792
Filename
629792
Link To Document