Title :
Radiation testing results of COTS based space microcircuits
Author :
Layton, P. ; Strobel, David ; Anthony, Hal ; Boss, Robert ; Marshall, Jim ; Parkinson, John ; Spratt, Jim ; Passenheim, Burr
Author_Institution :
Space Electron. Inc., San Diego, CA, USA
Abstract :
We present both heavy ion single event effect (SEE) and total ionizing dose (TID) data collected at Space Electronics Inc. for candidate spacecraft microelectronics
Keywords :
failure analysis; integrated circuit reliability; integrated circuit testing; ion beam effects; space vehicle electronics; COTS; heavy ion single event effect; radiation testing; space microcircuits; spacecraft microelectronics; total ionizing dose; Aerospace electronics; Cobalt; Cyclotrons; Dosimetry; Electronic equipment testing; Field programmable gate arrays; Integrated circuit testing; Laboratories; Microelectronics; Space technology;
Conference_Titel :
Radiation Effects Data Workshop, 1997 IEEE
Conference_Location :
Snowmass Village, CO
Print_ISBN :
0-7803-4061-2
DOI :
10.1109/REDW.1997.629792
