DocumentCode :
3288100
Title :
Validation of reduced-terminal models in fast SSN analysis
Author :
Xinhai Jiang ; Oh, Dan
Author_Institution :
Rambus Inc., Sunnyvale, CA, USA
fYear :
2012
fDate :
21-24 Oct. 2012
Firstpage :
216
Lastpage :
219
Abstract :
Simultaneous switching noise (SSN) continues to play an important role in single-ended signaling systems. Modeling and simulating SSN is quite challenging as it requires a complex system model comprised of numerous signal, power, and ground conductors and planes. An efficient modeling approach based on the special property associated with SSN simulation assumptions was published previously. It assumed a worst case switching noise condition where all SSN aggressors were switching at the same time with same data pattern. Under this assumption, the complexity of the model is drastically reduced by introducing the supernet which is a non-physical net representing all the aggressors´ impact. In this paper, we present numerical validation of the previous modeling approach.
Keywords :
S-parameters; circuit noise; numerical analysis; S-parameter model; SSN aggressors; SSN simulation; complex system model; data pattern; fast SSN analysis; ground conductors; reduced-terminal models; simultaneous switching noise; single-ended signaling systems; Accuracy; Analytical models; Approximation methods; Computational modeling; Integrated circuit modeling; Noise; Numerical models; SSN; SSO; modeling reduction; power integrity; terminal reduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
Type :
conf
DOI :
10.1109/EPEPS.2012.6457880
Filename :
6457880
Link To Document :
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