Title :
Numerical Mode Ling of Discharge Voltage of Reverse-Biased P-N Junction
Author :
Korolev, M.A. ; Shvets, A.V. ; Krasyukov, A.Yu. ; Klyuchnikov, A.S.
Keywords :
Charge carriers; Charge measurement; Current measurement; Electron beams; P-n junctions; Problem-solving; Signal synthesis; Testing; Tree graphs; Voltage;
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
5-7782-0662-3
DOI :
10.1109/APEIE.2006.4292447
