DocumentCode :
3288188
Title :
Automated testing using PXI and IVI technologies
Author :
Bingham, Eric A.
Author_Institution :
Boeing Co., St. Louis, MO, USA
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
30
Lastpage :
36
Abstract :
When selecting instruments for use in an automated testing environment, the engineer is presented with numerous options. The make, model, feature set, and reliability of each device are common factors in this decision. However, the type of bus over which the instrument communicates is what often governs the ultimate decision. An Ethernet-based system may be selected because of the high speed it affords, while a GPIB-based setup may be selected due to the vast selection of devices available that use this type of interface. This paper presents the advantages of using PXI devices in conjunction with IVI drivers, which include compact size, ease of integration, and cost-effectiveness. This paper then provides empirical data comparing the performance of PXI against that of GPIB. It also demonstrates how IVI technology facilitates the design of a system containing devices of several different interfaces.
Keywords :
automatic test equipment; device drivers; peripheral interfaces; system buses; Ethernet-based system; GPIB-based setup; IVI drivers; PCI extensions; PXI devices; automated testing environment; general-purpose interface bus; interchangeable virtual instrument driver; Automatic testing; Design engineering; Firewire; Instruments; Manufacturing; Measurement standards; Protocols; Reliability engineering; Test equipment; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2004. Proceedings
ISSN :
1088-7725
Print_ISBN :
0-7803-8449-0
Type :
conf
DOI :
10.1109/AUTEST.2004.1436753
Filename :
1436753
Link To Document :
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