Title :
Digest of Papers. 1992 IEEE VLSI Test Symposium. 10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip (Cat. No.92TH0437-4)
Abstract :
Presents the cover from the proceedings of this conference.
Keywords :
VLSI; automatic testing; boundary scan testing; built-in self test; integrated circuit testing; logic design; logic testing; IDDQ testing; boundary scan; built-in self-test; delay testing; design for testability; design verification; error checking; fault modeling; mixed-signal testing; test generation; yield;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232708
