Title :
A design for testability scheme to reduce test application time in full scan
Author :
Pradhan, Dhiraj K. ; Saxena, Jayashree
Author_Institution :
Massachusetts Univ., Amherst, MA, USA
Abstract :
Full scan is a widely accepted design for testability technique for sequential circuits. However, the test application time required by full scan could be high because of the necessity to scan in and scan out test vectors. In this paper, a hybrid scheme is presented that aims to reduce test application time in circuits with full scan. The proposed scheme exploits the inherent sequential nature of the circuit in conjunction with the additional controllability and observability available through full scan. Also, it is shown that the hybrid scheme has an additional advantage of being suited for testing transition faults.<>
Keywords :
boundary scan testing; design for testability; logic testing; sequential circuits; controllability; design for testability; full scan; hybrid scheme; observability; sequential circuits; test application time; test vectors; transition faults; Circuit faults; Circuit testing; Controllability; DH-HEMTs; Design for testability; Electrical fault detection; Fault detection; Hybrid power systems; Sequential analysis; Sequential circuits;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232724
