• DocumentCode
    3288408
  • Title

    Nonlinear block-type leapfrog scheme for the fast simulation of multiconductor transmission lines with nonlinear drivers and terminations

  • Author

    Sekine, Taku ; Asai, Hiroki

  • Author_Institution
    Dept. of Syst. Eng., Shizuoka Univ., Hamamatsu, Japan
  • fYear
    2012
  • fDate
    21-24 Oct. 2012
  • Firstpage
    284
  • Lastpage
    287
  • Abstract
    This paper describes a fast transient simulation technique based on a block-type leapfrog scheme for general nonlinear circuits. In existing leapfrog-based techniques, there is a restriction on dealing with nonlinear elements in the circuit. On the other hand, the block-type leapfrog scheme is suitable for the simulation of tightly coupled networks such as the equivalent circuit of multiconductor transmission lines (MTLs). In this work, we extend the block-type leapfrog scheme to incorporate generalized nonlinear elements, which have two or more terminals such as MOSFETs. The proposed method partitions the circuit into some kinds of local blocks, and locally dense and nonlinear calculations are effectively confined within each relatively-small block. Example simulations of MTLs with nonlinear drivers and terminations show that the leapfrog-based nonlinear solver is much more efficient than HSPICE.
  • Keywords
    driver circuits; equivalent circuits; multiconductor transmission lines; MTL; block-type leapfrog scheme; generalized nonlinear elements; multiconductor transmission lines equivalent circuit; nonlinear block-type leapfrog scheme; nonlinear calculations; nonlinear circuits; nonlinear drivers; nonlinear elements; relatively-small block; terminations; tightly coupled networks; transient simulation technique; CMOS integrated circuits; Integrated circuit modeling; Inverters; MOS devices; Nonlinear circuits; Semiconductor device modeling; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
  • Conference_Location
    Tempe, AZ
  • Print_ISBN
    978-1-4673-2539-4
  • Electronic_ISBN
    978-1-4673-2537-0
  • Type

    conf

  • DOI
    10.1109/EPEPS.2012.6457897
  • Filename
    6457897