Title :
Coset error detection in BIST design
Author :
Nagvajara, Prawat ; Karpovsky, Mark G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
Abstract :
A finite-field algebraic description of a built-in self-test (BIST) design based on primitive feedback shift registers (LFSRs) implementing the test generator and the signature analyzer (SA) is presented. That the BIST schemes that use the TG and the SA with the same feedback polynomial detect errors which distort the output functions of the circuits-under-test for a set of the input vectors forming a coset of a subspace. The authors term this type of error the \´single coset error\´. Signature schemes which detect the coset errors of multiplicity r are further described, (r>
Keywords :
built-in self test; feedback; logic testing; shift registers; BIST design; built-in self-test; coset; error detection; feedback polynomial; finite-field algebraic description; input vectors; output functions; primitive feedback shift registers; signature analyzer; single coset error; subspace; test generator; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Feedback; Polynomials; Probability; Programmable logic arrays; Shift registers; Vectors;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232728
