DocumentCode
3288478
Title
A mixed signal tester solution for: standards traceable AC calibration of analog modules
Author
Abate, Mark F.
Author_Institution
Advantest America Inc., Milford, MA, USA
fYear
1992
fDate
7-9 April 1992
Firstpage
84
Lastpage
89
Abstract
Presents a mixed signal test system architecture focused at reducing the overall cost of test. Illustrated are the tester architecture, accuracy and traceability achievements, as well as the benefits realized in the reduction of factors contributing to the overall cost of test.<>
Keywords
VLSI; automatic test equipment; calibration; integrated circuit testing; measurement standards; analog modules; mixed signal tester solution; overall cost; standards traceable AC calibration; tester architecture; traceability; Automatic testing; Calibration; Control system synthesis; Costs; DC generators; Frequency; Signal generators; System testing; Timing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-7803-0623-6
Type
conf
DOI
10.1109/VTEST.1992.232729
Filename
232729
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