Title :
A mixed signal tester solution for: standards traceable AC calibration of analog modules
Author_Institution :
Advantest America Inc., Milford, MA, USA
Abstract :
Presents a mixed signal test system architecture focused at reducing the overall cost of test. Illustrated are the tester architecture, accuracy and traceability achievements, as well as the benefits realized in the reduction of factors contributing to the overall cost of test.<>
Keywords :
VLSI; automatic test equipment; calibration; integrated circuit testing; measurement standards; analog modules; mixed signal tester solution; overall cost; standards traceable AC calibration; tester architecture; traceability; Automatic testing; Calibration; Control system synthesis; Costs; DC generators; Frequency; Signal generators; System testing; Timing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232729
